Commerce Department publishes rule on Nov. 1

The US Commerce Department published a one page rule on Nov. 1, according to the U.S. Government Publishing Office.

The rule is focused on Communications With the Patent and Trademark Office.

The Department includes the Census Bureau, which is used to determine many factors about American life. Downsizing the Federal Government, a project aimed at lowering taxes and boosting federal efficiency, said the Department is involved in misguided foreign trade policies and is home to many unneeded programs.

Notices are required documents detailing rules and regulations being proposed by each federal department. This allows the public to see what issues legislators and federal departments are focusing on.

Any person or organization can comment on the proposed rules. Departments and agencies must then address “significant issues raised in comments and discuss any changes made,” the Federal Register says.

Notices published by the Commerce Department on Nov. 1

Title
Fisheries of the Exclusive Economic Zone Off Alaska; Deep-Water Flatfish, Rex Sole and Arrowtooth Flounder in Statistical Area 620 of the Gulf of Alaska
Communications With the Patent and Trademark Office
Fisheries of the Exclusive Economic Zone Off Alaska; North Pacific Fisheries Research Plan; Interim Groundfish Observer Program
High Power Microwave Amplifiers and Components Thereof From Japan: Initiation and Preliminary Results of Changed Circumstances Antidumping Duty Administrative Review, and Intent To Revoke Order in Part
Notice of Extension of Time Limit for Antidumping Duty Administrative Review of Certain Circular Welded Carbon Steel Pipes and Tubes From Thailand
Certain Welded Carbon Steel Pipes and Tubes From Thailand: Final Results of Antidumping Duty Administrative Review
Certain Hot-Rolled Lead and Bismuth Carbon Steel Products From the United Kingdom; Final Results of Antidumping Duty Administrative Review
NTIS Advisory Board Meeting
Announcement of an Opportunity To Join a Cooperative Research and Development Consortium for CD-Metrology Below 0.25 Microns