Notice published by Commerce Department on Oct. 21

Notice published by Commerce Department on Oct. 21

The US Commerce Department published a two page notice on Oct. 21, according to the U.S. Government Publishing Office.

The notice is focused on Fresh Garlic from the People's Republic of China: Partial Rescission of Antidumping Duty Administrative Review.

The Department includes the Census Bureau, which is used to determine many factors about American life. Downsizing the Federal Government, a project aimed at lowering taxes and boosting federal efficiency, said the Department is involved in misguided foreign trade policies and is home to many unneeded programs.

Notices are required documents detailing rules and regulations being proposed by each federal department. This allows the public to see what issues legislators and federal departments are focusing on.

Any person or organization can comment on the proposed rules. Departments and agencies must then address “significant issues raised in comments and discuss any changes made,” the Federal Register says.

Notices published by the Commerce Department on Oct. 21

Title
Sea Turtle Conservation; Fisheries of the Caribbean, Gulf of Mexico, and South Atlantic
Fresh Garlic from the People's Republic of China: Partial Rescission of Antidumping Duty Administrative Review
Certain Tissue Paper Products from the People's Republic of China: Notice of Partial Rescission of Antidumping Duty Administrative Review
Request for Comments and Notice of Roundtable on Work Sharing for Patent Applications
Certain Sodium and Potassium Phosphate Salts From the People's Republic of China: Initiation of Antidumping Duty Investigation
Foreign-Trade Zone 174 Tucson, Arizona, Application for Expansion and Reorganization under Alternative Site Framework
Certain Pasta From Turkey: Final Results of Countervailing Duty Changed Circumstances Review
Endangered Species; File No. 14726
North Dakota State University, et al., Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes

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